Stress Variations Due to Microcracks in GaAs Grown on Si

    Research output: Contribution to journalArticle

    Original languageAmerican English
    Pages (from-to)2236-2238
    Number of pages3
    JournalApplied Physics Letters
    Issue number26
    StatePublished - 1987

    Bibliographical note

    Work performed by GTE Laboratories, Waltham, Massachusetts, and Solar Energy Research Institute, Golden, Colorado

    NREL Publication Number

    • ACNR/JA-213-9850

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