Structural and Electronic Studies of Defects in Amorphous Silicon; Technical Progress Report; Report No. 1; Report Period May-July 1981

    Research output: NRELSubcontract Report

    Original languageAmerican English
    Number of pages25
    StatePublished - 1981

    Bibliographical note

    Work performed by Xerox Corporation, Palo Alto Research Center, Palo Alto, California

    NREL Publication Number

    • SERI/PR-9079-1-T4

    Other Report Number

    • SERI/PR-9079-1-T4

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