Structural and Electronic Studies of Defects in Amorphous Silicon; Technical Progress Report; Report No. 1; Report Period May-July 1981

Research output: NLR › Subcontract Report

Work performed by Xerox Corporation, Palo Alto Research Center, Palo Alto, California

NLR Publication Number

@misc{d2129f8685644b4d972f8271d217b74f,

title = "Structural and Electronic Studies of Defects in Amorphous Silicon; Technical Progress Report; Report No. 1; Report Period May-July 1981",

author = "NREL",

note = "Work performed by Xerox Corporation, Palo Alto Research Center, Palo Alto, California",

year = "1981",

language = "American English",

type = "Other",

}