Structural and Electronic Studies of Defects in Amorphous Silicon; Report No. 2; August-October 1981

    Research output: NLR › Subcontract Report

    Original languageAmerican English
    Number of pages13
    StatePublished - 1981

    Bibliographical note

    Work performed by Xerox Corporation, Palo Alto, California

    NLR Publication Number

    • SERI/PR-9079-1-T5

    Other Report Number

    • SERI/PR-9079-1-T5

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