Structural Characterization of Composition-Modulated ZnSe1-xTex Epitaxial Films

Structural Characterization of Composition-Modulated ZnSe1-xTex Epitaxial Films

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Abstract

We examine the microstructure of short-period composition modulations in epitaxial ZnSe1-xTex (x .approx. 0.5) films grown by molecular-beam epitaxy (MBE) on vicinal (001) GaAs. Transmission electron microscope (TEM) images of cross-sections reveal highly-periodic contrast along the growth direction throughout the full thicknesses of the films that corresponds to a nearly sinusoidal variationbetween Se- and Te-rich compositions. Growth of ZnSe1-xTex at 285 deg. C on substrates tilted 4 degrees toward [111] maximizes the strength and regularity of the modulation. Using dynamical electron-diffraction simulations, we estimate a modulation amplitude of r=0.184(7) in a sample showing strong modulation. We assume a small amplitude of strain modulation to fit the experimental data.

Original language	American English
Pages	295-300
Number of pages	6
State	Published - 1996
Event	Materials Research Society Symposium - Boston, Massachusetts Duration: 28 Nov 1995 → 30 Nov 1995

Conference

Conference	Materials Research Society Symposium
City	Boston, Massachusetts
Period	28/11/95 → 30/11/95

NREL Publication Number

NREL/CP-21711

Cite this

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title = "Structural Characterization of Composition-Modulated ZnSe1-xTex Epitaxial Films",

abstract = "We examine the microstructure of short-period composition modulations in epitaxial ZnSe1-xTex (x .approx. 0.5) films grown by molecular-beam epitaxy (MBE) on vicinal (001) GaAs. Transmission electron microscope (TEM) images of cross-sections reveal highly-periodic contrast along the growth direction throughout the full thicknesses of the films that corresponds to a nearly sinusoidal variationbetween Se- and Te-rich compositions. Growth of ZnSe1-xTex at 285 deg. C on substrates tilted 4 degrees toward [111] maximizes the strength and regularity of the modulation. Using dynamical electron-diffraction simulations, we estimate a modulation amplitude of r=0.184(7) in a sample showing strong modulation. We assume a small amplitude of strain modulation to fit the experimental data.",

author = "NREL",

year = "1996",

language = "American English",

pages = "295--300",

note = "Materials Research Society Symposium ; Conference date: 28-11-1995 Through 30-11-1995",

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TY - CONF

T1 - Structural Characterization of Composition-Modulated ZnSe1-xTex Epitaxial Films

AU - NREL, null

PY - 1996

Y1 - 1996

N2 - We examine the microstructure of short-period composition modulations in epitaxial ZnSe1-xTex (x .approx. 0.5) films grown by molecular-beam epitaxy (MBE) on vicinal (001) GaAs. Transmission electron microscope (TEM) images of cross-sections reveal highly-periodic contrast along the growth direction throughout the full thicknesses of the films that corresponds to a nearly sinusoidal variationbetween Se- and Te-rich compositions. Growth of ZnSe1-xTex at 285 deg. C on substrates tilted 4 degrees toward [111] maximizes the strength and regularity of the modulation. Using dynamical electron-diffraction simulations, we estimate a modulation amplitude of r=0.184(7) in a sample showing strong modulation. We assume a small amplitude of strain modulation to fit the experimental data.

AB - We examine the microstructure of short-period composition modulations in epitaxial ZnSe1-xTex (x .approx. 0.5) films grown by molecular-beam epitaxy (MBE) on vicinal (001) GaAs. Transmission electron microscope (TEM) images of cross-sections reveal highly-periodic contrast along the growth direction throughout the full thicknesses of the films that corresponds to a nearly sinusoidal variationbetween Se- and Te-rich compositions. Growth of ZnSe1-xTex at 285 deg. C on substrates tilted 4 degrees toward [111] maximizes the strength and regularity of the modulation. Using dynamical electron-diffraction simulations, we estimate a modulation amplitude of r=0.184(7) in a sample showing strong modulation. We assume a small amplitude of strain modulation to fit the experimental data.

UR - http://www.scopus.com/inward/record.url?scp=0029703075&partnerID=8YFLogxK

M3 - Paper

SP - 295

EP - 300

T2 - Materials Research Society Symposium

Y2 - 28 November 1995 through 30 November 1995

ER -

Structural Characterization of Composition-Modulated ZnSe1-xTex Epitaxial Films

Abstract

Conference

NREL Publication Number

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