Structure and Electrical Characterization of Polycrystalline Semiconductor Materials

Structure and Electrical Characterization of Polycrystalline Semiconductor Materials

Research output: Contribution to conference › Paper

Original language	American English
Pages	567-574
Number of pages	8
State	Published - 1985
Event	Microscopic Identification of Electronic Defects in Semiconductors: Materials Research Society Symposium - San Francisco, California Duration: 15 Apr 1985 → 18 Apr 1985

Conference

Conference	Microscopic Identification of Electronic Defects in Semiconductors: Materials Research Society Symposium
City	San Francisco, California
Period	15/04/85 → 18/04/85

NREL Publication Number

ACNR/CP-213-6693

Cite this

@conference{c682c5da4fc74d8a8d067e8846080786,

title = "Structure and Electrical Characterization of Polycrystalline Semiconductor Materials",

author = "NREL",

year = "1985",

language = "American English",

pages = "567--574",

note = "Microscopic Identification of Electronic Defects in Semiconductors: Materials Research Society Symposium ; Conference date: 15-04-1985 Through 18-04-1985",

}