Structure Determination of a Planar Defect in SrBi2Ta2O9

Y. Yan, M. M. Al-Jassim, Z. Xu, X. Lu, D. Viehland, M. Payne, S. J. Pennycook

Research output: Contribution to journalArticlepeer-review

20 Scopus Citations

Abstract

The atomic structure of a planar defect with a (001) habit plane in single crystal layered perovskite SrBi2Ta2O9 is determined by high-resolution Z-contrast imaging. We found that the defect forms a structure, with two Sr-Ta-O perovskite blocks connected by a metallic Sr2 plane, rather than a Bi2O2 layer as in the perfect crystal. This defect is expected to be an efficient hole trap and may have important implications for the electronic properties and the ferroelectric response of the SrBi2Ta2O9 material.

Original languageAmerican English
Pages (from-to)1961-1963
Number of pages3
JournalApplied Physics Letters
Volume75
Issue number13
DOIs
StatePublished - 1999

NREL Publication Number

  • NREL/JA-520-26654

Fingerprint

Dive into the research topics of 'Structure Determination of a Planar Defect in SrBi2Ta2O9'. Together they form a unique fingerprint.

Cite this