Structure of Silicon-Based Thin Film Solar Cell Materials: Annual Technical Progress Report, 1 April 2002--31 August 2003

    Research output: NRELSubcontract Report

    Abstract

    The purpose of this research is to achieve a better understanding to improve materials used as the intrinsic layers of amorphous and microcrystalline silicon-based solar cells. Fundamental structural properties will be investigated on atomic and nano-scales. A powerful combination of techniques will be used: analytical high-resolution transmission electron microscopy (HRTEM), including specialassociated spectroscopic methods, small-angle scattering techniques (SAXS, ASAXS, SANS), and conventional wide-angle X-ray diffraction (XRD).
    Original languageAmerican English
    Number of pages77
    StatePublished - 2004

    Bibliographical note

    Work performed by the Colorado School of Mines, Golden, Colorado

    NREL Publication Number

    • NREL/SR-520-35227

    Keywords

    • amorphous silicon
    • atomic and nano-scales
    • high-resolution transmission electron microscopy (HRTEM)
    • intrinsic layers
    • microcrystalline
    • PV
    • small-angle x-ray scattering (SAXS)
    • solar cells
    • x-ray diffraction (XRD)

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