Structure of Silicon-Based Thin Film Solar Cell Materials: Annual Technical Progress Report, 1 April 2002--31 August 2003

Research output: NRELSubcontract Report

Abstract

The purpose of this research is to achieve a better understanding to improve materials used as the intrinsic layers of amorphous and microcrystalline silicon-based solar cells. Fundamental structural properties will be investigated on atomic and nano-scales. A powerful combination of techniques will be used: analytical high-resolution transmission electron microscopy (HRTEM), including specialassociated spectroscopic methods, small-angle scattering techniques (SAXS, ASAXS, SANS), and conventional wide-angle X-ray diffraction (XRD).
Original languageAmerican English
Number of pages77
StatePublished - 2004

Bibliographical note

Work performed by the Colorado School of Mines, Golden, Colorado

NREL Publication Number

  • NREL/SR-520-35227

Keywords

  • amorphous silicon
  • atomic and nano-scales
  • high-resolution transmission electron microscopy (HRTEM)
  • intrinsic layers
  • microcrystalline
  • PV
  • small-angle x-ray scattering (SAXS)
  • solar cells
  • x-ray diffraction (XRD)

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