Abstract
The purpose of this research is to achieve a better understanding to improve materials used as the intrinsic layers of amorphous and microcrystalline silicon-based solar cells. Fundamental structural properties will be investigated on atomic and nano-scales. A powerful combination of techniques will be used: analytical high-resolution transmission electron microscopy (HRTEM), including specialassociated spectroscopic methods, small-angle scattering techniques (SAXS, ASAXS, SANS), and conventional wide-angle X-ray diffraction (XRD).
Original language | American English |
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Number of pages | 77 |
State | Published - 2004 |
Bibliographical note
Work performed by the Colorado School of Mines, Golden, ColoradoNREL Publication Number
- NREL/SR-520-35227
Keywords
- amorphous silicon
- atomic and nano-scales
- high-resolution transmission electron microscopy (HRTEM)
- intrinsic layers
- microcrystalline
- PV
- small-angle x-ray scattering (SAXS)
- solar cells
- x-ray diffraction (XRD)