Studies of the Electrical and Interface Properties of the Metal Contacts to CuInSe2 Single Crystals

F. A. Abou-Elfotouh, L. L. Kazmerski, R. J. Matson, D. J. Dunlavy, T. J. Coutts

Research output: Contribution to journalArticlepeer-review

14 Scopus Citations

Abstract

The electrical behavior of the metal contacts and ITQ and CdS junctions to single crystals of CuInSe2has been studied using I-V and electron beam induced current measurements, then correlated to the chemical composition and intrinsic defect states in the semiconductor. The results have indicated that the contact resistance, junction characteristics, and crystalline order of surfaces are controlled mainly by the type and relative concentration of the intrinsic defect states dominating the copper-indium-deselenide material; these states are very sensitive to heat treatments and surface preparation procedures. Correlation between the behavior of different samples (polycrystalline thin films or single crystals) should be based upon similarities in the type and relative concentration instead of the chemical composition.

Original languageAmerican English
Pages (from-to)3251-3254
Number of pages4
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume8
Issue number4
DOIs
StatePublished - Jul 1990

NREL Publication Number

  • ACNR/JA-213-11882

Fingerprint

Dive into the research topics of 'Studies of the Electrical and Interface Properties of the Metal Contacts to CuInSe2 Single Crystals'. Together they form a unique fingerprint.

Cite this