Studies on the Use of Liquid Surface Passivation for Lifetime Measurements on Good-Quality Silicon Wafers

S. Devayajanam; P. Rupnowski; S. Shet; B. L. Sopori; N. M. Ravindra; D. Caskey; J. Chang; J. Covington

doi:10.1109/pvsc.2011.6186272

Studies on the Use of Liquid Surface Passivation for Lifetime Measurements on Good-Quality Silicon Wafers

S. Devayajanam, P. Rupnowski, S. Shet, B. L. Sopori, N. M. Ravindra, D. Caskey, J. Chang, J. Covington

Materials Science

Research output: Contribution to conference › Paper › peer-review

2 Scopus Citations

Abstract

We evaluated several liquid passivants, viz. solutions of iodine ethanol (IE), quinhydrone methanol (QHM), and potassium cyanide (KCN), for measuring minority-carrier lifetime. Lifetime was measured by the WCT-100 (Sinton Instruments) and WT-2000 (Semilab). Our results show that both IE and QHM passivation are reliable mechanisms. We also find that the KCN solution is moderately passivating on oxidized surfaces, but is only minimally effective on bare Si surfaces. This paper presents details of our studies. In particular, the effect of illumination on IE-passivated surfaces and possible reasons for variations in lifetime measurement are discussed.

Original language	American English
Pages	1647-1651
Number of pages	5
DOIs	https://doi.org/10.1109/pvsc.2011.6186272 https://doi.org/10.1109/PVSC.2011.6186272
State	Published - 2011
Event	37th IEEE Photovoltaic Specialists Conference, PVSC 2011 - Seattle, WA, United States Duration: 19 Jun 2011 → 24 Jun 2011

Conference

Conference	37th IEEE Photovoltaic Specialists Conference, PVSC 2011
Country/Territory	United States
City	Seattle, WA
Period	19/06/11 → 24/06/11

NREL Publication Number

NREL/CP-5200-50741

Keywords

liquid passivants
silicon wafers
surface passivation

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Devayajanam, S., Rupnowski, P., Shet, S., Sopori, B. L., Ravindra, N. M., Caskey, D., Chang, J., & Covington, J. (2011). Studies on the Use of Liquid Surface Passivation for Lifetime Measurements on Good-Quality Silicon Wafers. 1647-1651. Paper presented at 37th IEEE Photovoltaic Specialists Conference, PVSC 2011, Seattle, WA, United States. https://doi.org/10.1109/pvsc.2011.6186272, https://doi.org/10.1109/PVSC.2011.6186272

@conference{b44862f4234f471bb8a7670213649ac5,

title = "Studies on the Use of Liquid Surface Passivation for Lifetime Measurements on Good-Quality Silicon Wafers",

abstract = "We evaluated several liquid passivants, viz. solutions of iodine ethanol (IE), quinhydrone methanol (QHM), and potassium cyanide (KCN), for measuring minority-carrier lifetime. Lifetime was measured by the WCT-100 (Sinton Instruments) and WT-2000 (Semilab). Our results show that both IE and QHM passivation are reliable mechanisms. We also find that the KCN solution is moderately passivating on oxidized surfaces, but is only minimally effective on bare Si surfaces. This paper presents details of our studies. In particular, the effect of illumination on IE-passivated surfaces and possible reasons for variations in lifetime measurement are discussed.",

keywords = "liquid passivants, silicon wafers, surface passivation",

author = "S. Devayajanam and P. Rupnowski and S. Shet and Sopori, {B. L.} and Ravindra, {N. M.} and D. Caskey and J. Chang and J. Covington",

year = "2011",

doi = "10.1109/pvsc.2011.6186272",

language = "American English",

pages = "1647--1651",

note = "37th IEEE Photovoltaic Specialists Conference, PVSC 2011 ; Conference date: 19-06-2011 Through 24-06-2011",

}

Devayajanam, S, Rupnowski, P, Shet, S, Sopori, BL, Ravindra, NM, Caskey, D, Chang, J & Covington, J 2011, 'Studies on the Use of Liquid Surface Passivation for Lifetime Measurements on Good-Quality Silicon Wafers', Paper presented at 37th IEEE Photovoltaic Specialists Conference, PVSC 2011, Seattle, WA, United States, 19/06/11 - 24/06/11 pp. 1647-1651. https://doi.org/10.1109/pvsc.2011.6186272, https://doi.org/10.1109/PVSC.2011.6186272

TY - CONF

T1 - Studies on the Use of Liquid Surface Passivation for Lifetime Measurements on Good-Quality Silicon Wafers

AU - Devayajanam, S.

AU - Rupnowski, P.

AU - Shet, S.

AU - Sopori, B. L.

AU - Ravindra, N. M.

AU - Caskey, D.

AU - Chang, J.

AU - Covington, J.

PY - 2011

Y1 - 2011

N2 - We evaluated several liquid passivants, viz. solutions of iodine ethanol (IE), quinhydrone methanol (QHM), and potassium cyanide (KCN), for measuring minority-carrier lifetime. Lifetime was measured by the WCT-100 (Sinton Instruments) and WT-2000 (Semilab). Our results show that both IE and QHM passivation are reliable mechanisms. We also find that the KCN solution is moderately passivating on oxidized surfaces, but is only minimally effective on bare Si surfaces. This paper presents details of our studies. In particular, the effect of illumination on IE-passivated surfaces and possible reasons for variations in lifetime measurement are discussed.

AB - We evaluated several liquid passivants, viz. solutions of iodine ethanol (IE), quinhydrone methanol (QHM), and potassium cyanide (KCN), for measuring minority-carrier lifetime. Lifetime was measured by the WCT-100 (Sinton Instruments) and WT-2000 (Semilab). Our results show that both IE and QHM passivation are reliable mechanisms. We also find that the KCN solution is moderately passivating on oxidized surfaces, but is only minimally effective on bare Si surfaces. This paper presents details of our studies. In particular, the effect of illumination on IE-passivated surfaces and possible reasons for variations in lifetime measurement are discussed.

KW - liquid passivants

KW - silicon wafers

KW - surface passivation

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DO - 10.1109/pvsc.2011.6186272

M3 - Paper

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SP - 1647

EP - 1651

T2 - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011

Y2 - 19 June 2011 through 24 June 2011

ER -

Studies on the Use of Liquid Surface Passivation for Lifetime Measurements on Good-Quality Silicon Wafers

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Keywords

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