Study of the Defect Levels, Electrooptics, and Interface Properties of Polycrystalline CdTe and CdS Thin Films and Their Junction

F. A. Abulfotuh, A. Balcioglu, T. Wangensteen, H. R. Moutinho, F. Hassoon, A. Al-Douri, A. Alnajjar, L. L. Kazmerski

Research output: Contribution to conferencePaperpeer-review

11 Scopus Citations

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