Submicron Thickness Characterization of Poly-Si Thin Films on Textured Surfaces by X-Ray Diffraction for Minimizing Parasitic Absorption in Poly-Si/SiO2 Passivating Contact Cells

Kejun Chen, Vincenzo LaSalvia, William Nemeth, San Theingi, Harvey Guthrey, Matthew Hartenstein, Abhijit Kale, Matthew Page, Alex Bothwell, James Sites, Paul Stradins, Sumit Agarwal, David Young

Research output: Contribution to conferencePaperpeer-review

Fingerprint

Dive into the research topics of 'Submicron Thickness Characterization of Poly-Si Thin Films on Textured Surfaces by X-Ray Diffraction for Minimizing Parasitic Absorption in Poly-Si/SiO2 Passivating Contact Cells'. Together they form a unique fingerprint.

Engineering

Material Science