Substrate Roughness and Density of States of Poly-Si Films Deposited on Glass-Ceramics

Substrate Roughness and Density of States of Poly-Si Films Deposited on Glass-Ceramics

NREL

Research output: Contribution to conference › Paper

Original language	American English
Pages	170-173
Number of pages	4
State	Published - 2000
Event	10th Workshop on Crystalline Silicon Solar Cell Materials and Processes - Copper Mountain, Colorado Duration: 14 Aug 2000 → 16 Aug 2000

Conference

Conference	10th Workshop on Crystalline Silicon Solar Cell Materials and Processes
City	Copper Mountain, Colorado
Period	14/08/00 → 16/08/00

Bibliographical note

Work performed by Cornell University, Ithaca, New York and Corning Incorporated, Corning, New York

NLR Publication Number

NREL/CP-520-29144

Cite this

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title = "Substrate Roughness and Density of States of Poly-Si Films Deposited on Glass-Ceramics",

author = "NREL",

note = "Work performed by Cornell University, Ithaca, New York and Corning Incorporated, Corning, New York; 10th Workshop on Crystalline Silicon Solar Cell Materials and Processes ; Conference date: 14-08-2000 Through 16-08-2000",

year = "2000",

language = "American English",

pages = "170--173",

}

TY - CONF

T1 - Substrate Roughness and Density of States of Poly-Si Films Deposited on Glass-Ceramics

AU - NREL, null

N1 - Work performed by Cornell University, Ithaca, New York and Corning Incorporated, Corning, New York

PY - 2000

Y1 - 2000

M3 - Paper

SP - 170

EP - 173

T2 - 10th Workshop on Crystalline Silicon Solar Cell Materials and Processes

Y2 - 14 August 2000 through 16 August 2000

ER -