Abstract
In the Surface Analysis group, within the National Center for Photovoltaic's Measurements and Characterization Division, we use surface analytical techniques help to determine the chemical, elemental, and molecular composition, and electronic structure of material surfaces and interfaces. The properties of the surface and outer few micrometers of a material often control the electrical, chemical,or mechanical properties of that material--hence, this region is of extreme importance. Our techniques use ions, electrons, and X-ray or ultraviolet photons in high vacuum to probe surfaces and interfaces of a material. We map the elemental and chemical composition of specimens, study impurities and grain boundaries, gather bonding and chemical-state information, measure surface electronicproperties, and perform depth profiles to determine doping and elemental distributions. We have analyzed a wide range of materials, including photovoltaics, microelectronics, polymers, and biological specimens. We work collaboratively with you to solve materials- and device-related R&D problems. This sheet describes our major technique capabilities.
Original language | American English |
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Number of pages | 4 |
State | Published - 2006 |
NREL Publication Number
- NREL/BR-520-40122
Keywords
- capabilities
- measurements and characterization
- NCPV
- NREL
- surface analysis
- techniques