Abstract
We present surface analysis of close-spaced sublimated (CSS) CdTe after various pre-contact treatments. Our methods include Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS), and grazing-incidence x-ray diffraction (GI-XRD). XPS and GI-XRD analyses of the surface residue left by our solution-based CdCl2 treatment do not indicate the presence of a significant amount ofCdCl2. In addition, the solubility properties and relatively high thermal stability of the residue suggest the presence of the oxychloride Cd3Cl2O2 rather than CdCl2 as the major chlorine-containing component. Of the methods tested for their effectiveness in removing the residue, only HNO3 etches removed all detectable traces of chlorine from the surface.
| Original language | American English |
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| Number of pages | 5 |
| State | Published - 1998 |
| Event | 2nd World Conference on Photovoltaic Solar Energy Conversion - Vienna, Austria Duration: 6 Jul 1998 → 10 Jul 1998 |
Conference
| Conference | 2nd World Conference on Photovoltaic Solar Energy Conversion |
|---|---|
| City | Vienna, Austria |
| Period | 6/07/98 → 10/07/98 |
NREL Publication Number
- NREL/CP-530-23876