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Surface and Interface Analysis of GaAs-Oxyfluorides
P. J. Ireland
, O. Jamjoum
,
L. L. Kazmerski
,
R. K. Ahrenkiel
, P. E. Russell
, W. Stanchina
, J.F. Wagner
Materials Science
National Renewable Energy Laboratory
University of Notre Dame
Hughes Research
Research output
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Contribution to journal
›
Article
›
peer-review
2
Scopus Citations
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Material Science
Auger Electron Spectroscopy
33%
Film
100%
Gallium Arsenide
100%
Oxide Compound
33%
Secondary Ion Mass Spectrometry
33%
Engineering
Gallium Arsenide
100%
Major Constituent
50%