@article{65d0e5b392804a9f88d857d6a6bd54f2,
title = "Survey of Potential-Induced Degradation in Thin-Film Modules: Article No. 053083",
keywords = "accelerated lifetime testing, CdTe, CID, CIGS, current-induced degradation, PID, potential-induced degradation, thin films",
author = "Peter Hacke and Kent Terwilliger and Gregory Perrin and Sarah Kurtz and Keith Showalter and John Sherwin and Eric Schneller and Stephen Barkaszi and Ryan Smith",
year = "2015",
doi = "10.1117/1.JPE.5.053083",
language = "American English",
volume = "5",
journal = "Journal of Photonics for Energy",
issn = "1947-7988",
number = "1",
}