Survey of Potential-Induced Degradation in Thin-Film Modules: Article No. 053083

Peter Hacke, Kent Terwilliger, Gregory Perrin, Sarah Kurtz, Keith Showalter, John Sherwin, Eric Schneller, Stephen Barkaszi, Ryan Smith

Research output: Contribution to journalArticlepeer-review

27 Scopus Citations
Original languageAmerican English
Number of pages14
JournalJournal of Photonics for Energy
Issue number1
StatePublished - 2015

NREL Publication Number

  • NREL/JA-5J00-64982


  • accelerated lifetime testing
  • CdTe
  • CID
  • CIGS
  • current-induced degradation
  • PID
  • potential-induced degradation
  • thin films

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