Survey of Potential-Induced Degradation in Thin-Film Modules: Paper No. 95630B

Research output: Contribution to conferencePaper

2 Scopus Citations
Original languageAmerican English
Number of pages11
DOIs
StatePublished - 2015
EventReliability of Photovoltaic Cells, Modules, Components, and Systems VIII: SPIE Conference - San Diego, California
Duration: 9 Aug 201513 Aug 2015

Conference

ConferenceReliability of Photovoltaic Cells, Modules, Components, and Systems VIII: SPIE Conference
CitySan Diego, California
Period9/08/1513/08/15

NREL Publication Number

  • NREL/CP-5J00-64786

Keywords

  • accelerated lifetime testing
  • CdTe
  • CID
  • CIGS
  • current-induced degradation
  • PID
  • potential-induced degradation
  • thin films

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