Symmetry of GaAs1-xNx Conduction-Band Minimum Probed by Resonant Raman Scattering

M. J. Seong, H. M. Cheong, S. Yoon, J. F. Geisz, A. Mascarenhas, M. J. Seong, H. M. Cheong, S. Yoon, J. F. Geisz, A. Mascarenhas

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Abstract

The nature of the conduction-band minimum of (formula presented) (formula presented) is probed by performing resonant Raman scattering (RRS) on thin layers of (formula presented) epitaxially grown on Ge substrates. Strong resonance enhancement of the LO-phonon Raman intensity is observed with excitation energies near the (formula presented) as well as (formula presented) transitions. However, in contrast to the distinct LO-phonon linewidth resonance enhancement and activation of various X and L zone-boundary phonons brought about slightly below and near the (formula presented) transition, respectively, we have not observed any resonant LO-phonon linewidth broadening or activation of sharp zone-boundary phonons near the (formula presented) transition. The observed RRS results reveal that the conduction-band minimum of (formula presented) predominantly consists of the delocalized GaAs bulklike states of (formula presented) symmetry.

Original languageAmerican English
Article number153301
Number of pages4
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume67
Issue number15
DOIs
StatePublished - 2 Apr 2003

NREL Publication Number

  • NREL/JA-590-34474

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