Synchrotron-Based Investigations into Metallic Impurity Distribution and Defect Engineering in Multicrystalline Silicon via Thermal Treatments

Synchrotron-Based Investigations into Metallic Impurity Distribution and Defect Engineering in Multicrystalline Silicon via Thermal Treatments

Research output: Contribution to conference › Paper

Original language	American English
Pages	1027-1030
Number of pages	4
State	Published - 2005
Event	Thirty-First IEEE Photovoltaic Specialists Conference-2005 - Lake Buena Vista, Florida Duration: 3 Jan 2005 → 7 Jan 2005

Conference

Conference	Thirty-First IEEE Photovoltaic Specialists Conference-2005
City	Lake Buena Vista, Florida
Period	3/01/05 → 7/01/05

NREL Publication Number

NREL/CP-520-38897

Cite this

@conference{90c30aef75bf4d26958abfce53c9e19e,

title = "Synchrotron-Based Investigations into Metallic Impurity Distribution and Defect Engineering in Multicrystalline Silicon via Thermal Treatments",

author = "NREL",

year = "2005",

language = "American English",

pages = "1027--1030",

note = "Thirty-First IEEE Photovoltaic Specialists Conference-2005 ; Conference date: 03-01-2005 Through 07-01-2005",

}