@article{10d306396ae34a838b7bfd02545dae50,
title = "Techniques for Improving the Si-SiO2 Interface Characterization",
author = "NREL",
note = "Work performed by SRI International, Menlo Park, California; Lockheed Palo Alto Research Laboratory, Palo Alto, California; RCA Technical Center, Summerfield, New Jersey; and Solar Energy Research Institute, Golden, Colorado",
year = "1983",
doi = "10.1063/1.332744",
language = "American English",
volume = "54",
pages = "5183--5198",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics",
number = "9",
}