TEM Characterization of III-V Semiconductors Heteroepitaxially Grown on Si Substrates

Research output: Contribution to conference › Paper

Original language	American English
Pages	688-689
Number of pages	2
State	Published - 1989
Event	47th Annual Meeting of the Electron Microscopy Society of America - Austin, Texas Duration: 14 Aug 1989 → 18 Aug 1989

Conference	47th Annual Meeting of the Electron Microscopy Society of America
City	Austin, Texas
Period	14/08/89 → 18/08/89

NREL Publication Number

@conference{45a8a6e24ade4ba4b0d2a157cd753e3c,

title = "TEM Characterization of III-V Semiconductors Heteroepitaxially Grown on Si Substrates",

author = "NREL",

year = "1989",

language = "American English",

pages = "688--689",

note = "47th Annual Meeting of the Electron Microscopy Society of America ; Conference date: 14-08-1989 Through 18-08-1989",

}