Abstract
Photovoltaic (PV) cells and modules are often rated in terms of a set of standard reporting conditions defined by a temperature, spectral irradiance, and total irradiance. Because PV devices operate over a wide range of temperatures and irradiances, the temperature and irradiance-related behavior must be known. This paper surveys the temperature dependence of crystalline and thin-film, state-of-the-art, research-size cells, modules, and systems measured by a variety of methods. The various error sources and measurement methods that contribute to cause differences in the temperature coefficient for a given cell or module measured with various methods are discussed.
Original language | American English |
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Pages | 1275-1278 |
Number of pages | 4 |
DOIs | |
State | Published - 1996 |
Event | Proceedings of the 1996 25th IEEE Photovoltaic Specialists Conference - Washington, DC, USA Duration: 13 May 1996 → 17 May 1996 |
Conference
Conference | Proceedings of the 1996 25th IEEE Photovoltaic Specialists Conference |
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City | Washington, DC, USA |
Period | 13/05/96 → 17/05/96 |
NREL Publication Number
- NREL/CP-22523