Test-to-Failure of Crystalline Silicon Modules

David Trudell

doi:10.1109/PVSC.2010.5614472

Test-to-Failure of Crystalline Silicon Modules

David Trudell

National Renewable Energy Laboratory

Research output: Contribution to conference › Paper

Original language	American English
Pages	000244-000250
Number of pages	7
DOIs	https://doi.org/10.1109/PVSC.2010.5614472
State	Published - 2010
Event	35th IEEE Photovoltaic Specialists Conference (PVSC '10) - Honolulu, Hawaii Duration: 20 Jun 2010 → 25 Jun 2010

Conference

Conference	35th IEEE Photovoltaic Specialists Conference (PVSC '10)
City	Honolulu, Hawaii
Period	20/06/10 → 25/06/10

NREL Publication Number

NREL/CP-520-49953

Keywords

accelerated lifetime testing
damp heat
solar cells
thermal cycling

Access to Document

10.1109/PVSC.2010.5614472

Cite this

@conference{223340704bb743eeb675767b781b7321,

title = "Test-to-Failure of Crystalline Silicon Modules",

keywords = "accelerated lifetime testing, damp heat, solar cells, thermal cycling",

author = "David Trudell",

year = "2010",

doi = "10.1109/PVSC.2010.5614472",

language = "American English",

pages = "000244--000250",

note = "35th IEEE Photovoltaic Specialists Conference (PVSC '10) ; Conference date: 20-06-2010 Through 25-06-2010",

}

TY - CONF

T1 - Test-to-Failure of Crystalline Silicon Modules

AU - Trudell, David

PY - 2010

Y1 - 2010

KW - accelerated lifetime testing

KW - damp heat

KW - solar cells

KW - thermal cycling

UR - http://www.scopus.com/inward/record.url?scp=78650123343&partnerID=8YFLogxK

U2 - 10.1109/PVSC.2010.5614472

DO - 10.1109/PVSC.2010.5614472

M3 - Paper

SP - 244

EP - 250

T2 - 35th IEEE Photovoltaic Specialists Conference (PVSC '10)

Y2 - 20 June 2010 through 25 June 2010

ER -

Test-to-Failure of Crystalline Silicon Modules

Conference

NREL Publication Number

Keywords

Access to Document

Other files and links

Fingerprint

Cite this