@misc{43902ebbbb004262a35b68f33b9c8b5d,
title = "Testing Modules for Potential-Induced Degradation - A Status Update of IEC 62804 (Presentation): NREL (National Renewable Energy Laboratory)",
abstract = "Stresses and degradation rates for the 25 degrees C with foil and the 60 degrees C/85% RH damp heat tests are compared, the Illumination factor on PID rate is evaluated, and measurement techniques and stress levels are discussed.",
keywords = "modules, photovoltaic systems, silicon solar cells",
author = "Peter Hacke",
year = "2014",
language = "American English",
series = "Presented at the NREL PV Module Reliability Workshop, 25-26 February 2014, Golden, Colorado",
type = "Other",
}
