Abstract
A variety of test methodologies are commonly used to assess if a photovoltaic ('PV') system is able to perform in-line with expectations generated by a computer simulation. Four commonly used methodologies include: the PVUSA rating as implemented in ASTM E2848 and E2939 ('ASTM'), a Performance Ratio Test ('PR'), the Power Performance Index ('PPI') and the Adjusted Energy Test ('AET'). This paper compares the results of a one year AET to short term ASTM, PR, PPI, and AET test results in an attempt to determine which test can best reproduce the results of a one-year AET. Test durations of 3, 7, 15, and 30 days were evaluated to examine the effect of test duration on the residual between the short term test result and the long term AET test result. Seasonality was also examined. This study was not able to identify a single test methodology which consistently outperformed the others, nor was this study able to determine the optimum test duration.
Original language | American English |
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Pages | 901-906 |
Number of pages | 6 |
DOIs | |
State | Published - 15 Oct 2014 |
Event | 40th IEEE Photovoltaic Specialist Conference, PVSC 2014 - Denver, United States Duration: 8 Jun 2014 → 13 Jun 2014 |
Conference
Conference | 40th IEEE Photovoltaic Specialist Conference, PVSC 2014 |
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Country/Territory | United States |
City | Denver |
Period | 8/06/14 → 13/06/14 |
Bibliographical note
Publisher Copyright:© 2014 IEEE.
NREL Publication Number
- NREL/CP-5J00-62138
Keywords
- photovoltaic systems power generation
- solar power generation