The Effects of Absorber Thickness on Reverse-Bias Damage in Cu(In,Ga)Se2 Solar Cells

Research output: Contribution to conferencePaperpeer-review

1 Scopus Citations

Abstract

We studied a variety of absorber thicknesses in Cu(In,Ga)Se2 devices to examine the ability of the cell to withstand reverse current flow without damage. Absorbers were varied from 2.5 μm to 0.4 μm, with the expectation that larger reverse current would be allowed to flow at lower voltages as absorbers were made thinner. Our initial experiments showed promise. However, as the efficiency of thin devices was improved, the reverse current allowed at a given voltage decreased. Here we present our negative results on the ability of thin devices to allow higher reverse currents at lower voltages. We also give details on our procedures for reverse-bias testing small-area solar cells. We hope this information will be useful for those who want to study reverse-bias at the cell level.

Original languageAmerican English
Pages3201-3205
Number of pages5
DOIs
StatePublished - Jun 2019
Event46th IEEE Photovoltaic Specialists Conference, PVSC 2019 - Chicago, United States
Duration: 16 Jun 201921 Jun 2019

Conference

Conference46th IEEE Photovoltaic Specialists Conference, PVSC 2019
Country/TerritoryUnited States
CityChicago
Period16/06/1921/06/19

Bibliographical note

Publisher Copyright:
© 2019 IEEE.

NREL Publication Number

  • NREL/CP-5K00-73138

Keywords

  • cell-level reliability
  • CIGS
  • Cu(In,Ga)Se
  • electric breakdown
  • photovoltaic cells
  • reliability
  • reverse bias

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