The Electrical, Optical and Structural Properties of InxZn1-xOy (0<x<1) Thin Films by Combinatorial Techniques

Matthew P. Taylor, Dennis W. Readey, Charles W. Teplin, Maikel F.A.M. van Hest, Jeff L. Alleman, Matthew S. Dabney, Lynn M. Gedvilas, Brian M. Keyes, Bobby To, John D. Perkins, David S. Ginley

Research output: Contribution to journalArticlepeer-review

56 Scopus Citations

Abstract

Indium-zinc-oxide (IZO) compositional libraries were deposited with dc magnetron sputtering onto glass substrates at 100 °C and analysed with high throughput, combinatorial techniques. The composition range from 4 to 95 at% In for Zn was explored. A peak in conductivity with σ > 3000 (Ω cm)-1 was observed at an indium content of ∼ 70%. The mobility exceeded 30 cm2 (V s) -1 and the carrier concentrations were greater than 8 × 1020 cm-3. Crystalline phases were observed for In concentrations less than 45% and greater than 80% with an intermediate amorphous region. The low indium content films have a zinc oxide type structure with a ZnO (002) spacing ranging from ∼ 2.61 to 2.85 Å for 4% In and 45% In, respectively. For indium contents between 82% and 95%, the In2O3 (222) spacing varied from 2.98 to 2.99 Å. Regardless of the composition or the degree of crystallinity, all films showed high optical transparency with the transmission >80% across the visible spectrum.

Original languageAmerican English
Pages (from-to)90-94
Number of pages5
JournalMeasurement Science and Technology
Volume16
Issue number1
DOIs
StatePublished - Jan 2005

NREL Publication Number

  • NREL/JA-520-37896

Keywords

  • Combinatorial
  • Indium-zinc-oxide
  • Sputtering
  • Thin films
  • Transparent conducting oxide

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