Abstract
Many of the studies on the entropy-stabilized oxide (Mg0.2Co0.2Ni0.2Cu0.2Zn0.2)O have been heavily application-based. Previous works have studied effects of cation stoichiometry on the entropy-driven reaction to form a single phase, but a fundamental exploration of the effects of anion stoichiometry and/or redox chemistry on electrical properties is lacking. Using near-edge X-ray absorption fine structure (NEXAFS) and electrical measurements, we show that oxidizing thin film samples of (Mg0.2Co0.2Ni0.2Cu0.2Zn0.2)O affects primarily the valence of Co, leaving the other cations in this high-entropy system unchanged. This oxidation increases electrical conduction in these thin films, which occurs via small polaron hopping mediated by the Co valence shift from 2+ to a mixed 2+/3+ state. In parallel, we show that bulk samples sintered in an oxygen-rich atmosphere have a lower activation energy for electrical conduction than those equilibrated in a nitrogen (reducing) atmosphere. Combining feasible defect compensation scenarios with electrical impedance measurements and NEXAFS data, we propose a self-consistent interpretation of Co redox-mediated small polaron conduction as the dominant method of charge transfer in this system.
Original language | American English |
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Pages (from-to) | 1531-1539 |
Number of pages | 9 |
Journal | Journal of the American Ceramic Society |
Volume | 106 |
Issue number | 2 |
DOIs | |
State | Published - 2023 |
Bibliographical note
Publisher Copyright:© 2022 The Authors. Journal of the American Ceramic Society published by Wiley Periodicals LLC on behalf of American Ceramic Society.
NREL Publication Number
- NREL/JA-5K00-83338
Keywords
- activation energy
- charge carrier
- entropy
- IV
- NEXAFS
- XANES
- XAS