The Thermal Reliability Study of Bypass Diodes in Photovoltaic Modules (Poster)

    Research output: NRELPoster

    Abstract

    This paper presents the result of high-temperature durability and thermal cycling testing and analysis for the selected diodes to study the detail of the thermal design and relative long-term reliability of the bypass diodes used to limit the detrimental effects of module hot-spot susceptibility.
    Original languageAmerican English
    StatePublished - 2013

    Publication series

    NamePresented at the 2013 Photovoltaic Module Reliability Workshop, 26-27 February 2013, Golden, Colorado

    NREL Publication Number

    • NREL/PO-5200-58225

    Keywords

    • diodes
    • PV
    • PVMRW
    • thermal reliability

    Fingerprint

    Dive into the research topics of 'The Thermal Reliability Study of Bypass Diodes in Photovoltaic Modules (Poster)'. Together they form a unique fingerprint.

    Cite this