@misc{576108aad1644e02802c3017dddd9110,
title = "The Thermal Reliability Study of Bypass Diodes in Photovoltaic Modules (Poster)",
abstract = "This paper presents the result of high-temperature durability and thermal cycling testing and analysis for the selected diodes to study the detail of the thermal design and relative long-term reliability of the bypass diodes used to limit the detrimental effects of module hot-spot susceptibility.",
keywords = "diodes, PV, PVMRW, thermal reliability",
author = "Jennifer Kurtz and Z. Zhang",
year = "2013",
language = "American English",
series = "Presented at the 2013 Photovoltaic Module Reliability Workshop, 26-27 February 2013, Golden, Colorado",
publisher = "National Renewable Energy Laboratory (NREL)",
address = "United States",
type = "Other",
}