Theoretical Analysis of the Minority Carrier Lifetime in a Multicrystalline Wafer with Spatially Varying Defect Distribution

Research output: Contribution to conference › Paper

Original language	American English
Pages	373-378
Number of pages	6
State	Published - 1998
Event	Defect and Impurity Engineered Semiconductors II: Materials Research Society Symposium - San Francisco, California Duration: 13 Apr 1998 → 17 Apr 1998

Conference	Defect and Impurity Engineered Semiconductors II: Materials Research Society Symposium
City	San Francisco, California
Period	13/04/98 → 17/04/98

NREL Publication Number

@conference{7fecadef80b840e9abb268950cf7ad6c,

title = "Theoretical Analysis of the Minority Carrier Lifetime in a Multicrystalline Wafer with Spatially Varying Defect Distribution",

author = "NREL",

year = "1998",

language = "American English",

pages = "373--378",

note = "Defect and Impurity Engineered Semiconductors II: Materials Research Society Symposium ; Conference date: 13-04-1998 Through 17-04-1998",

}