Thermal Activation of Deep Oxygen Defect Formation and Hydrogen Effusion in Hydrogenated Nanocrystalline Silicon Thin Films

Research output: Contribution to conferencePaper

Original languageAmerican English
Pages002995-003000
Number of pages6
DOIs
StatePublished - 2011
Event37th IEEE Photovoltaic Specialists Conference (PVSC '11) - Seattle, Washington
Duration: 19 Jun 201124 Jun 2011

Conference

Conference37th IEEE Photovoltaic Specialists Conference (PVSC '11)
CitySeattle, Washington
Period19/06/1124/06/11

NREL Publication Number

  • NREL/CP-5200-55710

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