Abstract
There is significant interest in the power electronics industry in transitioning from silicon to wide-bandgap devices. Gallium oxide devices have the potential to offer comparable or even superior performance than other wide-bandgap devices, but at a much lower cost. Recent breakthroughs include demonstration of a laboratory-scale gallium oxide transistors and diodes; however, a functional power electronics package for these devices is yet to be developed. In this paper, the research methodology in designing an electronics package for gallium oxide devices is outlined. Finite element-based thermal and thermomechanical modeling simulations were conducted to realize a package design that meets the combined target of minimal thermal resistance and improved reliability. Different package designs that include various material combinations and cooling configurations were explored, and their thermal and thermomechanical performance are reported. Furthermore, the short-circuit withstanding capabilities of gallium oxide devices were studied and compared with silicon carbide.
Original language | American English |
---|---|
Pages | 287-294 |
Number of pages | 8 |
DOIs | |
State | Published - 7 Dec 2018 |
Event | 6th Annual IEEE Workshop on Wide Bandgap Power Devices and Applications, WiPDA 2018 - Atlanta, United States Duration: 31 Oct 2018 → 2 Nov 2018 |
Conference
Conference | 6th Annual IEEE Workshop on Wide Bandgap Power Devices and Applications, WiPDA 2018 |
---|---|
Country/Territory | United States |
City | Atlanta |
Period | 31/10/18 → 2/11/18 |
Bibliographical note
See NREL/CP-5400-72291 for preprintNREL Publication Number
- NREL/CP-5400-73254
Keywords
- finite-element
- gallium oxide
- high-temperature packaging
- power electronics
- thermal modeling
- thermomechanical modeling
- wide-bandgap devices