Abstract
While the performance of metal halide perovskite light-emitting diodes (PeLEDs) has rapidly improved in recent years, their stability remains a bottleneck to commercial realization. Here, we show that the thermal stability of polymer hole-transport layers (HTLs) used in PeLEDs represents an important factor influencing the external quantum efficiency (EQE) roll-off and device lifetime. We demonstrate a reduced EQE roll-off, a higher breakdown current density of approximately 6 A cm-2, a maximum radiance of 760 W sr-1 m-2, and a longer device lifetime for PeLEDs using polymer HTLs with high glass-transition temperatures. Furthermore, for devices driven by nanosecond electrical pulses, a record high radiance of 1.23 MW sr-1 m-2 and an EQE of approximately 1.92% at 14.6 kA cm-2 are achieved. Thermally stable polymer HTLs enable stable operation of PeLEDs that can sustain more than 11.7 million electrical pulses at 1 kA cm-2 before device failure.
Original language | American English |
---|---|
Pages (from-to) | 4785-4792 |
Number of pages | 8 |
Journal | Nano Letters |
Volume | 23 |
Issue number | 11 |
DOIs | |
State | Published - 2023 |
NREL Publication Number
- NREL/JA-5900-86598
Keywords
- device stability
- EQE roll-off
- high power
- perovskite light-emitting devices
- pulsed operation