Thermal Properties of Polymer Hole-Transport Layers Influence the Efficiency Roll-Off and Stability of Perovskite Light-Emitting Diodes

  • Lianfeng Zhao
  • , Daniel Astridge
  • , William Gunnarsson
  • , Zhaojian Xu
  • , Jisu Hong
  • , Jonathan Scott
  • , Sara Kacmoli
  • , Khaled Al Kurdi
  • , Stephen Barlow
  • , Seth Marder
  • , Claire Gmachl
  • , Alan Sellinger
  • , Barry Rand

Research output: Contribution to journalArticlepeer-review

24 Scopus Citations

Abstract

While the performance of metal halide perovskite light-emitting diodes (PeLEDs) has rapidly improved in recent years, their stability remains a bottleneck to commercial realization. Here, we show that the thermal stability of polymer hole-transport layers (HTLs) used in PeLEDs represents an important factor influencing the external quantum efficiency (EQE) roll-off and device lifetime. We demonstrate a reduced EQE roll-off, a higher breakdown current density of approximately 6 A cm-2, a maximum radiance of 760 W sr-1 m-2, and a longer device lifetime for PeLEDs using polymer HTLs with high glass-transition temperatures. Furthermore, for devices driven by nanosecond electrical pulses, a record high radiance of 1.23 MW sr-1 m-2 and an EQE of approximately 1.92% at 14.6 kA cm-2 are achieved. Thermally stable polymer HTLs enable stable operation of PeLEDs that can sustain more than 11.7 million electrical pulses at 1 kA cm-2 before device failure.
Original languageAmerican English
Pages (from-to)4785-4792
Number of pages8
JournalNano Letters
Volume23
Issue number11
DOIs
StatePublished - 2023

NLR Publication Number

  • NREL/JA-5900-86598

Keywords

  • device stability
  • EQE roll-off
  • high power
  • perovskite light-emitting devices
  • pulsed operation

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