Thickness Evolution of the Microstructural and Optical Properties of Si:H Films in the Amorphous-to-Microcrystalline Phase Transition Region

A. S. Ferlauto, G. M. Ferreira, R. J. Koval, J. M. Pearce, C. R. Wronski, R. W. Collins, M. M. Al-Jassim, K. M. Jones

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