Thickness Evolution of the Microstructure of Si:H Films in the Amorphous-to-Microcrystalline Phase Transition Region

R. W. Collins, G. M. Ferreira, A. S. Ferlauto, R. J. Koval, J. M. Pearce, C. R. Wronski, M. M. Al-Jassim, K. M. Jones

Research output: Contribution to conference › Paper › peer-review

1 Scopus Citations

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