Abstract
We have fabricated high-efficiency thin-film CuIn1-xGaxSe2 (CIGS)-based photovoltaic devices from solution-based electroplated (EP) and auto-plated (AP) precursors. As-deposited precursors are Cu-rich CIGS. Compositions were adjusted to CuIn1-xGaxSe2 with additional In and Ga by physical vapor deposition (PVD) to the EP and AP precursor films. Auger analysis and grazing incident X-ray diffraction(GIXRD) were performed on devices prepared from EP and AP precursor films. We have also analyzed and compared EP, AP, and an PVD CIGS device by deep-level transient spectroscopy (DLTS).
Original language | American English |
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Number of pages | 7 |
State | Published - 2000 |
Event | 16th European PVSEC and Exhibition - Glasgow, Scotland Duration: 1 May 2000 → 5 May 2000 |
Conference
Conference | 16th European PVSEC and Exhibition |
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City | Glasgow, Scotland |
Period | 1/05/00 → 5/05/00 |
NREL Publication Number
- NREL/CP-590-28415