Abstract
A number of artifacts that affect the accuracy and meaning of characterization may be apparent in thin-film module measurements. Such artifacts are often negligible for small single thin-film cells or even single-crystal modules. Possible artifacts include artificially high or low cell series resistances during current-voltage measurements, artificially low quantum efficiencies, artificially low module currents or cell voltages, and misleading signals from selective illumination measurements.
Original language | American English |
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Pages | 829-832 |
Number of pages | 4 |
DOIs | |
State | Published - 1996 |
Externally published | Yes |
Event | Twenty Fifth IEEE Photovoltaic Specialists Conference - Washington, D.C. Duration: 13 May 1996 → 17 May 1996 |
Conference
Conference | Twenty Fifth IEEE Photovoltaic Specialists Conference |
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City | Washington, D.C. |
Period | 13/05/96 → 17/05/96 |
Bibliographical note
Work performed by Colorado State University, Fort Collins, ColoradoNREL Publication Number
- NREL/CP-22410