Thin-Film Module Measurement Artifacts

Research output: Contribution to conferencePaperpeer-review


A number of artifacts that affect the accuracy and meaning of characterization may be apparent in thin-film module measurements. Such artifacts are often negligible for small single thin-film cells or even single-crystal modules. Possible artifacts include artificially high or low cell series resistances during current-voltage measurements, artificially low quantum efficiencies, artificially low module currents or cell voltages, and misleading signals from selective illumination measurements.

Original languageAmerican English
Number of pages4
StatePublished - 1996
Externally publishedYes
EventTwenty Fifth IEEE Photovoltaic Specialists Conference - Washington, D.C.
Duration: 13 May 199617 May 1996


ConferenceTwenty Fifth IEEE Photovoltaic Specialists Conference
CityWashington, D.C.

Bibliographical note

Work performed by Colorado State University, Fort Collins, Colorado

NREL Publication Number

  • NREL/CP-22410


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