Thin-Film Reliability Trends Toward Improved Stability

D. C. Jordan; S. R. Kurtz

doi:10.1109/pvsc.2011.6186081

Thin-Film Reliability Trends Toward Improved Stability

D. C. Jordan, S. R. Kurtz

Materials Science

Research output: Contribution to conference › Paper › peer-review

20 Scopus Citations

Abstract

Long-term, stable performance of photovoltaic (PV) modules will be increasingly important to their successful penetration of the power grid. This paper summarizes more than 150 thin-film and more than 1700 silicon PV degradation rates (R _d) quoted in publications for locations worldwide. Partitioning the literature results by technology and date of installation statistical analysis shows an improvement in degradation rate especially for thin-film technologies in the last decade. A CIGS array deployed at NREL for more than 5 years that appears to be stable supports the literature trends. Indoor and outdoor data indicate undetectable change in performance (0.2±0.2 %/yr). One module shows signs of slight degradation from what appears to be an initial manufacturing defect, however it has not affected the overall system performance.

Original language	American English
Pages	827-832
Number of pages	6
DOIs	https://doi.org/10.1109/pvsc.2011.6186081 https://doi.org/10.1109/PVSC.2011.6186081
State	Published - 2011
Event	37th IEEE Photovoltaic Specialists Conference, PVSC 2011 - Seattle, WA, United States Duration: 19 Jun 2011 → 24 Jun 2011

Conference

Conference	37th IEEE Photovoltaic Specialists Conference, PVSC 2011
Country/Territory	United States
City	Seattle, WA
Period	19/06/11 → 24/06/11

Bibliographical note

See NREL/CP-5200-50726 for preprint

NREL Publication Number

NREL/CP-5200-55723

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

Cite this

@conference{8456fa83a76149e085d782f24b329d43,

title = "Thin-Film Reliability Trends Toward Improved Stability",

abstract = "Long-term, stable performance of photovoltaic (PV) modules will be increasingly important to their successful penetration of the power grid. This paper summarizes more than 150 thin-film and more than 1700 silicon PV degradation rates (R d) quoted in publications for locations worldwide. Partitioning the literature results by technology and date of installation statistical analysis shows an improvement in degradation rate especially for thin-film technologies in the last decade. A CIGS array deployed at NREL for more than 5 years that appears to be stable supports the literature trends. Indoor and outdoor data indicate undetectable change in performance (0.2±0.2 %/yr). One module shows signs of slight degradation from what appears to be an initial manufacturing defect, however it has not affected the overall system performance.",

author = "Jordan, {D. C.} and Kurtz, {S. R.}",

note = "See NREL/CP-5200-50726 for preprint; 37th IEEE Photovoltaic Specialists Conference, PVSC 2011 ; Conference date: 19-06-2011 Through 24-06-2011",

year = "2011",

doi = "10.1109/pvsc.2011.6186081",

language = "American English",

pages = "827--832",

}

TY - CONF

T1 - Thin-Film Reliability Trends Toward Improved Stability

AU - Jordan, D. C.

AU - Kurtz, S. R.

N1 - See NREL/CP-5200-50726 for preprint

PY - 2011

Y1 - 2011

N2 - Long-term, stable performance of photovoltaic (PV) modules will be increasingly important to their successful penetration of the power grid. This paper summarizes more than 150 thin-film and more than 1700 silicon PV degradation rates (R d) quoted in publications for locations worldwide. Partitioning the literature results by technology and date of installation statistical analysis shows an improvement in degradation rate especially for thin-film technologies in the last decade. A CIGS array deployed at NREL for more than 5 years that appears to be stable supports the literature trends. Indoor and outdoor data indicate undetectable change in performance (0.2±0.2 %/yr). One module shows signs of slight degradation from what appears to be an initial manufacturing defect, however it has not affected the overall system performance.

AB - Long-term, stable performance of photovoltaic (PV) modules will be increasingly important to their successful penetration of the power grid. This paper summarizes more than 150 thin-film and more than 1700 silicon PV degradation rates (R d) quoted in publications for locations worldwide. Partitioning the literature results by technology and date of installation statistical analysis shows an improvement in degradation rate especially for thin-film technologies in the last decade. A CIGS array deployed at NREL for more than 5 years that appears to be stable supports the literature trends. Indoor and outdoor data indicate undetectable change in performance (0.2±0.2 %/yr). One module shows signs of slight degradation from what appears to be an initial manufacturing defect, however it has not affected the overall system performance.

UR - http://www.scopus.com/inward/record.url?scp=84861088361&partnerID=8YFLogxK

U2 - 10.1109/pvsc.2011.6186081

DO - 10.1109/pvsc.2011.6186081

M3 - Paper

AN - SCOPUS:84861088361

SP - 827

EP - 832

T2 - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011

Y2 - 19 June 2011 through 24 June 2011

ER -

Thin-Film Reliability Trends Toward Improved Stability

Abstract

Conference

Bibliographical note

NREL Publication Number

UN SDGs

Access to Document

Other files and links

Fingerprint

Cite this