Thin-Film Reliability Trends Toward Improved Stability: Preprint

Research output: Contribution to conferencePaper


Long-term, stable performance of photovoltaic (PV) modules will be increasingly important to their successful penetration of the power grid. This paper summarizes more than 150 thin-film and more than 1700 silicon PV degradation rates (Rd) quoted in publications for locations worldwide. Partitioning the literature results by technology and date of installation statistical analysis shows animprovement in degradation rate especially for thin-film technologies in the last decade. A CIGS array deployed at NREL for more than 5 years that appears to be stable supports the literature trends. Indoor and outdoor data indicate undetectable change in performance (0.2+/-0.2 %/yr). One module shows signs of slight degradation from what appears to be an initial manufacturing defect, however ithas not affected the overall system performance.
Original languageAmerican English
Number of pages8
StatePublished - 2011
Event37th IEEE Photovoltaic Specialists Conference (PVSC 37) - Seattle, Washington
Duration: 19 Jun 201124 Jun 2011


Conference37th IEEE Photovoltaic Specialists Conference (PVSC 37)
CitySeattle, Washington

NREL Publication Number

  • NREL/CP-5200-50726


  • module reliability
  • modules
  • PV
  • reliability
  • thin films


Dive into the research topics of 'Thin-Film Reliability Trends Toward Improved Stability: Preprint'. Together they form a unique fingerprint.

Cite this