Abstract
A novel time-of-flight technique has been developed for simultaneously measuring minority-carrier lifetime and diffusivity in homojunctions. A pulsed dye laser produces electron-hole pairs near the front surface of the device. A delay occurs before the onset of photocurrent due to the diffusion transit time of minority carriers to the junction. An analysis of this effect by both a simplified analytical model and a computer simulation gives similar results for the current as a function of time. A fit of the theory to experimental data on Al0.25Ga0.75As n/p homojunctions produces minority-carrier lifetime, diffusivity, and diffusion length.
| Original language | American English |
|---|---|
| Pages (from-to) | 725-727 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 49 |
| Issue number | 12 |
| DOIs | |
| State | Published - 1986 |
NREL Publication Number
- ACNR/JA-213-7141