Abstract
A study was performed on time-resolved photoluminescence measurements of CdTe solar cells. A measure of recombination near the CdTe/CdS metallurgical interface that was strongly correlated to the open-circuit voltage was provided by the time-resolved photoluminescence measurements. It was found that the oxygen in the growth ambient during close-spaced sublimation generally reduced the recombination rate.
Original language | American English |
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Pages (from-to) | 3549-3555 |
Number of pages | 7 |
Journal | Journal of Applied Physics |
Volume | 94 |
Issue number | 5 |
DOIs | |
State | Published - 2003 |
NREL Publication Number
- NREL/JA-520-33393