Abstract
ITN Energy Systems, Inc., and Global Solar Energy, Inc., with the assistance of NREL's PV Manufacturing R&D program, have continued the advancement of CIGS production technology through the development of trajectory-oriented predictive/control models, fault-tolerance control, control-platform development, in-situ sensors, and process improvements. Modeling activities to date include thedevelopment of physics-based and empirical models for CIGS and sputter-deposition processing, implementation of model-based control, and application of predictive models to the construction of new evaporation sources and for control. Model-based control is enabled through implementation of reduced or empirical models into a control platform. Reliability improvement activities includeimplementation of preventive maintenance schedules; detection of failed sensors/equipment and reconfiguration to continue processing; and systematic development of fault prevention and reconfiguration strategies for the full range of CIGS PV production deposition processes. In-situ sensor development activities have resulted in improved control and indicated the potential for enhanced processstatus monitoring and control of the deposition processes. Substantial process improvements have been made, including significant improvement in CIGS uniformity, thickness control, efficiency, yield, and throughput. In large measure, these gains have been driven by process optimization, which, in turn, have been enabled by control and reliability improvements due to this PV Manufacturing R&Dprogram. This has resulted in substantial improvements of flexible CIGS PV module performance and efficiency.
Original language | American English |
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Number of pages | 43 |
State | Published - 2004 |
Bibliographical note
Work performed by ITN Energy Systems, Inc., Littleton, ColoradoNREL Publication Number
- NREL/SR-520-36983
Keywords
- back contacts
- fault tolerance
- in-situ sensors
- manufacturer
- module
- PV
- real-time composition
- small-area
- sputter deposition
- thin films
- trajectory-oriented control
- transparent conducting oxides (TCO)