Transmission Electron Microscopy and Scanning Electron Microscopy Characterization of GaP Grown by Metal-Organic Chemical Vapor Deposition on Silicon Substrates: (Abstract)

M. M. Al-Jassim

doi:10.1016/0379-6787(87)90166-9

Transmission Electron Microscopy and Scanning Electron Microscopy Characterization of GaP Grown by Metal-Organic Chemical Vapor Deposition on Silicon Substrates: (Abstract)

Materials Science

Research output: Contribution to conference › Paper › peer-review

Original language	American English
Pages	459-460
Number of pages	2
DOIs	https://doi.org/10.1016/0379-6787(87)90166-9 https://doi.org/10.1016/0379-6787(87)90166-9
State	Published - 1 Jun 1987
Event	Proc of the 7th Photovoltaic Adv Res and Dev Proj Rev Meet - Denver, CO, USA Duration: 13 May 1986 → 13 May 1986

Conference

Conference	Proc of the 7th Photovoltaic Adv Res and Dev Proj Rev Meet
City	Denver, CO, USA
Period	13/05/86 → 13/05/86

NREL Publication Number

ACNR/CP-213-9387

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Al-Jassim, M. M. (1987). Transmission Electron Microscopy and Scanning Electron Microscopy Characterization of GaP Grown by Metal-Organic Chemical Vapor Deposition on Silicon Substrates: (Abstract). 459-460. Paper presented at Proc of the 7th Photovoltaic Adv Res and Dev Proj Rev Meet, Denver, CO, USA. https://doi.org/10.1016/0379-6787(87)90166-9, https://doi.org/10.1016/0379-6787(87)90166-9

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title = "Transmission Electron Microscopy and Scanning Electron Microscopy Characterization of GaP Grown by Metal-Organic Chemical Vapor Deposition on Silicon Substrates: (Abstract)",

author = "Al-Jassim, {M. M.}",

year = "1987",

month = jun,

day = "1",

doi = "10.1016/0379-6787(87)90166-9",

language = "American English",

pages = "459--460",

note = "Proc of the 7th Photovoltaic Adv Res and Dev Proj Rev Meet ; Conference date: 13-05-1986 Through 13-05-1986",

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Al-Jassim, MM 1987, 'Transmission Electron Microscopy and Scanning Electron Microscopy Characterization of GaP Grown by Metal-Organic Chemical Vapor Deposition on Silicon Substrates: (Abstract)', Paper presented at Proc of the 7th Photovoltaic Adv Res and Dev Proj Rev Meet, Denver, CO, USA, 13/05/86 - 13/05/86 pp. 459-460. https://doi.org/10.1016/0379-6787(87)90166-9, https://doi.org/10.1016/0379-6787(87)90166-9

Transmission Electron Microscopy and Scanning Electron Microscopy Characterization of GaP Grown by Metal-Organic Chemical Vapor Deposition on Silicon Substrates: (Abstract). / Al-Jassim, M. M.
1987. 459-460 Paper presented at Proc of the 7th Photovoltaic Adv Res and Dev Proj Rev Meet, Denver, CO, USA.

Research output: Contribution to conference › Paper › peer-review

TY - CONF

T1 - Transmission Electron Microscopy and Scanning Electron Microscopy Characterization of GaP Grown by Metal-Organic Chemical Vapor Deposition on Silicon Substrates

T2 - Proc of the 7th Photovoltaic Adv Res and Dev Proj Rev Meet

AU - Al-Jassim, M. M.

PY - 1987/6/1

Y1 - 1987/6/1

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U2 - 10.1016/0379-6787(87)90166-9

DO - 10.1016/0379-6787(87)90166-9

M3 - Paper

AN - SCOPUS:0022735691

SP - 459

EP - 460

Y2 - 13 May 1986 through 13 May 1986

ER -

Transmission Electron Microscopy and Scanning Electron Microscopy Characterization of GaP Grown by Metal-Organic Chemical Vapor Deposition on Silicon Substrates: (Abstract)

Conference

NREL Publication Number

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