Transmission Electron Microscopy Study of Dislocations and Interfaces in CdTe Solar Cells

Yanfa Yan, Kim M. Jones, Mowafak M. Al-Jassim, Ramesh Dhere, Xuanzhi Wu

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10 Scopus Citations


We report on our transmission electron microscopy study of dislocations and interfaces in CdTe solar cells. The atomic structure of dislocations formed inside CdTe grains have been determined by atomic-resolution transmission electron microscopy. We discuss the electronic properties of the dislocations and explore the effects of oxygen on the interdiffusion at CdS/CdTe interface. We find that the presence of oxygen in either CdS or CdTe suppresses the interdiffusion at the CdS/CdTe interface. We have further investigated interdiffusion at the CdS/Zn2SnO4 interface. We find that Zn diffuses into CdS from Zn2SnO4 and Cd diffuses into Zn2SnO4 from CdS. The possible effects of the interdiffusion are discussed. Finally, we have examined the distribution of intentionally introduced Cu at the CdTe/CdS junction, and we find that Cu is distributed uniformly in the CdS layer.

Original languageAmerican English
Pages (from-to)7168-7172
Number of pages5
JournalThin Solid Films
Issue number21
StatePublished - 2011

NREL Publication Number

  • NREL/JA-5200-50581


  • CdTe
  • Defects
  • Interface
  • TEM


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