TY - GEN
T1 - Trial Run of a Junction-Box Attachment Test for Use in Photovoltaic Module Qualification (Presentation)
T2 - NREL (National Renewable Energy Laboratory)
AU - Miller, David
PY - 2014
Y1 - 2014
N2 - Engineering robust adhesion of the junction-box (j-box) is a hurdle typically encountered by photovoltaic (PV) module manufacturers during product development and manufacturing process control. There are historical incidences of adverse effects (e.g., fires), caused when the j-box/adhesive/module system has failed in the field. The addition of a weight to the j-box during the 'damp-heat','thermal-cycle', or 'creep' tests within the IEC qualification protocol is proposed to verify the basic robustness of the adhesion system. The details of the proposed test are described, in addition to a trial run of the test procedure. The described experiments examine 4 moisture-cured silicones, 4 foam tapes, and a hot-melt adhesive used in conjunction with glass, KPE, THV, and TPE substrates.For the purpose of validating the experiment, j-boxes were adhered to a substrate, loaded with a prescribed weight, and then subjected to aging. The replicate mock-modules were aged in an environmental chamber (at 85 deg C/85% relative humidity for 1000 hours; then 100 degrees C/<10% relative humidity for 200 hours) or fielded in Golden, Miami, and Phoenix for 1 year. Attachment strength tests,including pluck and shear test geometries, were also performed on smaller component specimens.
AB - Engineering robust adhesion of the junction-box (j-box) is a hurdle typically encountered by photovoltaic (PV) module manufacturers during product development and manufacturing process control. There are historical incidences of adverse effects (e.g., fires), caused when the j-box/adhesive/module system has failed in the field. The addition of a weight to the j-box during the 'damp-heat','thermal-cycle', or 'creep' tests within the IEC qualification protocol is proposed to verify the basic robustness of the adhesion system. The details of the proposed test are described, in addition to a trial run of the test procedure. The described experiments examine 4 moisture-cured silicones, 4 foam tapes, and a hot-melt adhesive used in conjunction with glass, KPE, THV, and TPE substrates.For the purpose of validating the experiment, j-boxes were adhered to a substrate, loaded with a prescribed weight, and then subjected to aging. The replicate mock-modules were aged in an environmental chamber (at 85 deg C/85% relative humidity for 1000 hours; then 100 degrees C/<10% relative humidity for 200 hours) or fielded in Golden, Miami, and Phoenix for 1 year. Attachment strength tests,including pluck and shear test geometries, were also performed on smaller component specimens.
KW - durability
KW - polymers
KW - reliability
M3 - Presentation
T3 - Presented at the Institute of Electrical and Electronics Engineers (IEEE) Photovoltaic Specialists Conference, 8-13 June 2014, Denver, Colorado
ER -
