Ultra-High Frequency Photoconductive Decay for Measuring Recombination Lifetime in Silicon

NREL

    Research output: Contribution to conference › Paper

    Original languageAmerican English
    Pages161-174
    Number of pages14
    StatePublished - 1996
    Event13th NREL Photovoltaics Program Review: Review Meeting - Lakewood, Colorado
    Duration: 16 May 1995 → 19 May 1995

    Conference

    Conference13th NREL Photovoltaics Program Review: Review Meeting
    CityLakewood, Colorado
    Period16/05/95 → 19/05/95

    NREL Publication Number

    • NREL/CP-21037

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