Ultralong Minority-Carrier Lifetime Epitaxial GaAs by Photon Recycling

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Abstract

The minority-carrier lifetime has been measured by time-resolved photoluminescence in epitaxial films of GaAs grown by metalorganic chemical vapor deposition. The measured lifetimes in thicker devices are 4 to 6 times the theoretical or radiative lifetime. These long lifetimes are the result of photon recycling or self-generation of the self-absorbed radiation.

Original languageAmerican English
Pages (from-to)1088-1090
Number of pages3
JournalApplied Physics Letters
Volume55
Issue number11
DOIs
StatePublished - 1989

Bibliographical note

Work performed by Solar Energy Research Institute, Golden, Colorado; Spire Corporation, Bedford, Massachusetts; and University of Colorado, Boulder, Colorado

NLR Publication Number

  • ACNR/JA-213-11353

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