Abstract
The minority-carrier lifetime has been measured by time-resolved photoluminescence in epitaxial films of GaAs grown by metalorganic chemical vapor deposition. The measured lifetimes in thicker devices are 4 to 6 times the theoretical or radiative lifetime. These long lifetimes are the result of photon recycling or self-generation of the self-absorbed radiation.
| Original language | American English |
|---|---|
| Pages (from-to) | 1088-1090 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 55 |
| Issue number | 11 |
| DOIs | |
| State | Published - 1989 |
Bibliographical note
Work performed by Solar Energy Research Institute, Golden, Colorado; Spire Corporation, Bedford, Massachusetts; and University of Colorado, Boulder, ColoradoNLR Publication Number
- ACNR/JA-213-11353