Abstract
Ultraviolet Fluorescence (UVF) is an inspection tool that can be used to identify cell cracks in some photovoltaic (PV) modules. Cell cracks can also be identified with electroluminescence (EL) and similar techniques, but it is generally not possible to differentiate new cracks from old ones with EL. UVF has a unique property of taking time for the cracks to show up, which could be used to differentiate new cracks (e.g., from a recent storm) from old ones (e.g., from installation damage). We perform tests on several different modules, some the same make and model but with different bill of materials (BOMs), to characterize the amount of time that it takes for crack signatures to progress in UVF.
Original language | American English |
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Pages | 2350-2355 |
Number of pages | 6 |
DOIs | |
State | Published - 14 Jun 2020 |
Event | 47th IEEE Photovoltaic Specialists Conference, PVSC 2020 - Calgary, Canada Duration: 15 Jun 2020 → 21 Aug 2020 |
Conference
Conference | 47th IEEE Photovoltaic Specialists Conference, PVSC 2020 |
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Country/Territory | Canada |
City | Calgary |
Period | 15/06/20 → 21/08/20 |
Bibliographical note
Publisher Copyright:© 2020 IEEE.
NREL Publication Number
- NREL/CP-5K00-76751
Keywords
- cell cracks
- PV Inspection
- storm damage
- ultraviolet fluorescence
- UVF